Optoelectronic wafer testing system for silicon photonics
High-precision and automated wafer-level evaluation of photonic chips!
We would like to introduce our "Optoelectronic Wafer Test System." This is an optoelectronic integrated wafer test system designed for the evaluation of silicon photonics and photonic integrated circuit (PIC) devices. By integrating optical measurements and electrical measurements, it enables high-precision and automated wafer-level evaluation of photonic chips. 【Features】 ■ High-precision measurement ■ Automated testing function ■ Flexible testing environment ■ Gratings and edge coupling compatible with different mode field diameters ■ Single die test support *For more details, please download the PDF or feel free to contact us.
- Company：日本レーザー
- Price：Other
